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--This paper investigates an approach to study the effects of upsets on the operation of microprocessorbased digital architectures. The method is based on the injection of bitf lips, randomly in time and location by using the capabilities of typical application boards. Experimental results, obtained on programs running on two different digital boards, built around an 80C51 microcontroller and a 320C50 Digital Signal Processor, illustrate the potentialities of this new strategy.

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The paper investigates a new technique to predict error rates in digital architectures based on microprocessors. Three studied cases are presented concerning three different processors. Two of them are included in the instruments of a satellite project. The actual space applications of these two instruments were implemented using the capabilities of a dedicated system. Results of the fault injection and radiation testing experiments and discussions about the potentialities of this technique are presente

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