A pre-coated steel sheet for household electrical appliances needs to be highly formable and stain resistant. In recent years, secondary ion mass spectrometry (SIMS) with a time-of-f light (TOF) mass analyzer with an Ar gas cluster ion beam (Ar-GCIB) has been widely used as a structure analysis technology of organic molecules. In this paper, we looked into the effectiveness of Ar-GCIB-TOF-SIMS as a structure analysis technique of paint film. As a result, we could detect the trimer fragment ions of hexamethoxymethylmelamine in the range of m/z = 400-800 for the first time for the spin-coating of HMMM on a Si wafer. By evaluation of characteristic monomer fragment ions, we could find out the different surface distributions of melamine-formaldehyde resin with the different formulations of paint films.

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In recent years, secondary ion mass spectrometry (SIMS) with a time-of-flight (TOF) mass analyzer has been widely used for analyzing the structures of organic molecules. In particular, TOF-SIMS with a cluster ion beam (Au n , Bi n , C 60 , Ar n , etc.) has been drawing attention as the technique can be used without destroying the structures of organic molecules. In this study, we imaged polyester/melamine resin using TOF-SIMS with bismuth cluster ions. By secondary ion imaging, we confirmed that the melamine formaldehyde resin was concentrated on the surface of the paint film. By comparing the difference between C 5 H 7 N 6 + (m/z = 151) and the other ions, we estimated that the degree of condensation of the melamine formaldehyde resin increased with a catalyst.