Abstract-A system for automatic generation of BuiltIn Self-Test (BIST) for embedded memory cores in a system-on-chip (SoC) is presented. The BIST approach tests RAMs of any address and data bus widths and can test both single-port and dual-port RAMs operating in synchronous or asynchronous mode. A Field Programmable Gate Array (FPGA) independent BIST model is developed using VHDL. The parameterized VHDL model has been synthesized and used to test various sizes and types of embedded RAMs in SoCs and FPGAs.

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