IntroductionOver the past decade, optical near-field techniques, especially scattering-type scanning near-field optical microscopy Infrared and optical spectroscopy represents one of the most informative methods in advanced materials research. As an important branch of modern optical techniques that has blossomed in the past decade, scattering-type scanning near-field optical microscopy (s-SNOM) promises deterministic characterization of optical properties over a broad spectral range at the nanoscale. It allows ultrabroadband optical (0.5-3000 µm) nanoimaging, and nanospectroscopy with fine spatial (<10 nm), spectral (<1 cm −1 ), and temporal (<10 fs) resolution. The history of s-SNOM is briefly introduced and recent advances which broaden the horizons of this technique in novel material research are summarized. In particular, this includes the pioneering efforts to study the nanoscale electrodynamic properties of plasmonic metamaterials, strongly correlated quantum materials, and polaritonic systems at room or cryogenic temperatures. Technical details, theoretical modeling, and new experimental methods are also discussed extensively, aiming to identify clear technology trends and unsolved challenges in this exciting field of research. and Astronomy. His research interests cover nanoscale and ultrafast electromagnetic responses of strongly correlated electron materials, 2D materials, and metamaterials that span from the near-infrared to terahertz frequencies.tip-sample interactions. In s-SNOM, these difficulties result from at least three factors. First, the well-known antenna effect [48] causes light to be highly confined between the probe apex and the sample surface. The specific geometry of the tip shank plays a significant role in determining the intensity of the scattered signal. [49] Second, in addition to the local optical information, a strong but undesired background signal can be detected. This background signal can be mainly attributed to the light scattering from the tip shank, cantilever, and sample surface. Third, due to the broad momentum distribution of the localized radiation, in some cases, nominally "far-field trivial" Adv. Mater. 2019, 31, 1804774 Figure 1. Far-field (blue) and near-field (yellow) measurements, accessing the propagating field and the evanescent field, respectively.The authors declare no conflict of interest.

Accessing the nonradiative near-field electromagnetic interactions with high in-plane momentum (q) is the key to achieve super resolution imaging far beyond the diffraction limit. At far-infrared and terahertz (THz) wavelengths (e.g., 300 μm = 1 terahertz = 4 meV), the study of high q response and nanoscale near-field imaging is still a nascent research field. In this work, we report on THz nanoimaging of exfoliated single and multilayer graphene flakes by using a state-of-the-art scattering-type near-field optical microscope (s-SNOM). We experimentally demonstrated that the single layer graphene is close to a perfect near-field reflector at ambient environment, comparable to that of the noble metal films at the same frequency range. Further modeling and analysis considering the nonlocal graphene conductivity indicate that the high near-field reflectivity of graphene is a rather universal behavior: graphene operates as a perfect high-q reflector at room temperature. Our work uncovers the unique high-q THz response of graphene, which is essential for future applications of graphene in nano-optics or tip-enhanced technologies.

In this letter, we report optical pump terahertz (THz) near-field probe (n-OPTP) and optical pump THz near-field emission (n-OPTE) experiments of graphene/InAs heterostructures. Near-field imaging contrasts between graphene and InAs using these newly developed techniques as well as spectrally integrated THz nano-imaging (THz s-SNOM) are systematically studied. We demonstrate that in the near-field regime (/ 6000 λ), a single layer of graphene is transparent to near-IR (800 nm) optical excitation and completely "screens" the photo-induced far-infrared (THz) dynamics in its substrate (InAs). Our work reveals unique frequency-selective ultrafast dynamics probed at the near field. It also provides strong evidence that n-OPTE nanoscopy yields contrast that distinguishes single-layer graphene from its substrate.

No abstract

No abstract