ÐThe primary goal of pattern recognition is supervised or unsupervised classification. Among the various frameworks in which pattern recognition has been traditionally formulated, the statistical approach has been most intensively studied and used in practice. More recently, neural network techniques and methods imported from statistical learning theory have been receiving increasing attention. The design of a recognition system requires careful attention to the following issues: definition of pattern classes, sensing environment, pattern representation, feature extraction and selection, cluster analysis, classifier design and learning, selection of training and test samples, and performance evaluation. In spite of almost 50 years of research and development in this field, the general problem of recognizing complex patterns with arbitrary orientation, location, and scale remains unsolved. New and emerging applications, such as data mining, web searching, retrieval of multimedia data, face recognition, and cursive handwriting recognition, require robust and efficient pattern recognition techniques. The objective of this review paper is to summarize and compare some of the well-known methods used in various stages of a pattern recognition system and identify research topics and applications which are at the forefront of this exciting and challenging field.

We develop a common theoretical framework for combining classifiers which use distinct pattern representations and show that many existing schemes can be considered as special cases of compound classification where all the pattern representations are used jointly to make a decision. An experimental comparison of various classifier combination schemes demonstrates that the combination rule developed under the most restrictive assumptions-the sum rule-outperforms other classifier combinations schemes. A sensitivity analysis of the various schemes to estimation errors is carried out to show that this finding can be justified theoretically.

Data domain description concerns the characterization of a data set. A good description covers all target data but includes no superfluous space. The boundary of a dataset can be used to detect novel data or outliers. We will present the Support Vector Data Description (SVDD) which is inspired by the Support Vector Classifier. It obtains a spherically shaped boundary around a dataset and analogous to the Support Vector Classifier it can be made flexible by using other kernel functions. The method is made robust against outliers in the training set and is capable of tightening the description by using negative examples. We show characteristics of the Support Vector Data Descriptions using artificial and real data.

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