The tangentially viewing visible and vertically viewing infrared cameras systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 µs respectively. The visible system was used to obtain 2-D poloidal profiles of CIII (465 nm) and D α (656.3 nm) emission with 20 µs integration during various stages of ELM events in the lower DIII-D divertor.
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