2003
DOI: 10.1063/1.1537037
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Diagnosis of edge localized mode evolution in DIII-D using fast-gated CID and infrared cameras

Abstract: The tangentially viewing visible and vertically viewing infrared cameras systems on DIII-D were upgraded to permit emission measurements during edge localized modes (ELMs) with integration times as short as 1 and 100 µs respectively. The visible system was used to obtain 2-D poloidal profiles of CIII (465 nm) and D α (656.3 nm) emission with 20 µs integration during various stages of ELM events in the lower DIII-D divertor.

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Cited by 17 publications
(13 citation statements)
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“…These variations produced a series of divertor solutions for each density case, ranging from high electron temperature at both inboard and outboard targets to an inboard divertor plasma with <5 eV electron temperature very near the X-point. These divertor solutions were compared to tangential camera images that were inverted into poloidal profiles of D a and CIII emission [10]. The CIII emission usually peaks at 8-10 eV and is thus a good marker of where neutral deuterium ionization path lengths become shorter.…”
Section: Analysis Approachmentioning
confidence: 99%
“…These variations produced a series of divertor solutions for each density case, ranging from high electron temperature at both inboard and outboard targets to an inboard divertor plasma with <5 eV electron temperature very near the X-point. These divertor solutions were compared to tangential camera images that were inverted into poloidal profiles of D a and CIII emission [10]. The CIII emission usually peaks at 8-10 eV and is thus a good marker of where neutral deuterium ionization path lengths become shorter.…”
Section: Analysis Approachmentioning
confidence: 99%
“…Multiple edge diagnostics were used to measure the 2D neutral particle (D a ) and carbon ion (CII/CIII) emission distribution in both the divertor and main diagnostic chamber region. The main tool of this paper is tangentially viewing charge injection device (CID) cameras [4,5], from which time-averaged 2D poloidal D a , CII (514 nm), and CIII (465 nm) distribution profiles were inferred, covering approximately 85% of the DIII-D poloidal cross-section ( Fig. 1).…”
Section: Introductionmentioning
confidence: 99%
“…8) [64] also showed the development of a poloidally localized density "finger" that breaks away from the pedestal during the ELM crash. Finally, CIII (465 nm) visible emission data from a tangentially viewing fastgated camera [65] at the midplane (Fig. 9), showed multiple filaments extended along the SOL flux surfaces.…”
Section: Elm Dynamics In the Pedestal And Midplane Solmentioning
confidence: 99%