As subwavelength nanostructures are receiving increasing attention for photonic and plasmonic applications, we grew nanostructured porous silicon (n-PS) and hybrid n-PS/Ag layers onto silicon substrates and measured their reflection and absorption characteristics as functions of the wavelength, angle of incidence, and polarization state of incident light. The experimental results show that the absorption characteristics of the hybrid n-PS/Ag layer can be controlled by selecting the appropriate combination of its thickness and porosity, together with the density of infiltrant silver nanoparticles. The observed wideband optical absorption characteristics of the hybrid n-PS/Ag layers might be useful in light-harvesting devices and photodetectors, since the overall efficiency will be increased as a result of increased field-of-view for both
s
- and
p
-polarization states of incident light.
Ti-doped ZnO thin films were obtained
with the aim of tailoring
ZnO film bioadhesiveness and making the optoelectronic properties
of ZnO materials transferable to biological environments. The films
were prepared on silicon substrates by sol–gel spin-coating
and subsequent annealing. A Ti–O segregation limits the ZnO
crystallite growth and creates a buffer out-layer. Consequently, the
Ti-doped ZnO presents slightly increased resistivity, which remains
in the order of 10
–3
Ω·cm. The strong
biochemical interference of Zn
2+
ions released from pure
ZnO surfaces was evidenced by culturing
Staphylococcus
epidermidis
with and without the Zn
2+
coupling
agent clioquinol. The Ti-doped ZnO surfaces showed a considerable
increase of bacterial viability with respect to pure ZnO. Cell adhesion
was assayed with human mesenchymal stem cells (hMSCs). Although hMSCs
find difficulties to adhere to the pure ZnO surface, they progressively
expand on the surface of ZnO when the Ti doping is increased. A preliminary
microdevice has been built on the Si substrate with a ZnO film doped
with 5% Ti. A one-dimensional micropattern with a zigzag structure
shows the preference of hMSCs for adhesion on Ti-doped ZnO with respect
to Si. The induced contrast of surface tension further induces a cell
polarization effect on hMSCs. It is suggested that the presence of
Ti–O covalent bonding on the doped surfaces provides a much
more stable ground for bioadhesion. Such fouling behavior suggests
an influence of Ti doping on film bioadhesiveness and sets the starting
point for the selection of optimal materials for implantable optoelectronic
devices.
Hybrid organic-inorganic self-powered photodetectors with three different configurations were fabricated and their optoelectronic performance was determined. Si is the inorganic active layer and the transparent conductor poly(3,4- ethylenedioxythiophene) polystyrene sulfonate...
The sol-gel process allows the high throughput formation of transition metal oxide thin films. Microwave plasma annealing (MwPA) treatments have been performed on thin films of two different transition metal oxides, Ta2O5 and ZnO, selected as representatives of covalently and strongly ionic bonded oxides, respectively. Ta2O5 has been explored as a dielectric barrier for porous silicon structures. The main limitation of the sol-gel spin coating in this case is the surface roughness of the coating, which is highly improved upon Ar MwPA. The treatment leads additionally to a microstructural activation and interface development comparable to a 500ºC thermal annealing. The MwPA of ZnO is a quasi-equivalent process to a 200ºC thermal annealing, preventing grain growth and promoting nanocrystalline phases. This is suggested to have a direct impact on the optical and electronic properties of the ZnO films. The MwPA films show wider optical band gap than thermally annealed ones. An impedance analysis further shows that the MwPA ZnO films present lower equivalent resistance and higher equivalent capacitance than the thermal films. These results are promising for the development of new processing routes for widely demanded transition metal oxide thin films.
The accurate determination of the electrical properties of photovoltaic devices is of utmost importance to predict and optimize their overall optoelectronic performance. For example, the minority carrier lifetime and the carrier diffusion length have a strong relationship with the carrier recombination rate. Additionally, parasitic resistances have an important effect on the fill factor of a solar cell. Within this context, the alternating current (AC) and direct current (DC) electrical characteristics of Si-based metal–insulator–semiconductor (MIS) Schottky barrier diodes with the basic structure Al/Si/TiO2/NiCr were studied, aiming at using them as photovoltaic devices. The basic diode structure was modified by adding nanostructured porous silicon (nanoPS) layers and by infiltrating silver nanoparticles (AgNPs) into the nanoPS layers, leading to Al/Si+nanoPS/TiO2/NiCr and Al/Si+nanoPS+AgNPs/TiO2/NiCr structures, respectively. The AC electrical properties were studied using a combination of electrochemical impedance spectroscopy and Mott–Schottky analysis, while the DC electrical properties were determined from current–voltage measurements. From the experimental results, an AC equivalent circuit model was proposed for the three different MIS Schottky barrier diodes under study. Additionally, the most significant electrical parameters were calculated. The results show a remarkable improvement in the performance of the MIS Schottky barrier diodes upon the addition of hybrid nanoPS layers with embedded Ag nanoparticles, opening the way to their use as photovoltaic devices.
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