Flexible, lightweight Cu(In,Ga)Se2 (CIGS) solar cells grown on polymer substrates are a promising technology with fast growing market prospects. However, power conversion efficiencies of solar cells grown at low temperatures (≈450 °C) remain below the efficiencies of cells grown at high temperature on glass substrates. This contribution discusses the impact on cell efficiency of process improvements of low‐temperature CIGS deposition on flexible polyimide and glass substrates. Different strategies for incorporation of alkali elements into CIGS are evaluated based on a large number of depositions. Postdeposition treatment with heavy alkali (here RbF) enables a thickness reduction of the CdS buffer layer and increases the open‐circuit voltage. Na supply during 3rd stage CIGS deposition positively impacts the cell performance. Coevaporation of heavy alkali (e.g., RbF) during capping layer deposition mitigates the adverse shunting associated with high Cu contents, yielding highest efficiencies with near‐stoichiometric absorber compositions. Furthermore, optimization of the deposition sequence results in absorbers with a 1 µm wide notch region with nearly constant bandgap minimum. The improved processes result in a record cell efficiency of 20.8% for CIGS on flexible substrate.
Four-terminal (4-T) tandem solar cells (e.g., perovskite/CuInSe2 (CIS)) rely on three transparent conductive oxide electrodes with high mobility and low free carrier absorption in the near-infrared (NIR) region. In this work, a reproducible In2O3:H (IO:H) film deposition process is developed by independently controlling H2 and O2 gas flows during magnetron sputtering, yielding a high mobility value up to 129 cm2 V–1 s–1 in highly crystallized IO:H films annealed at 230 °C. Optimization of H2 and O2 partial pressures further decreases the crystallization temperature to 130 °C. By using a highly crystallized IO:H film as the front electrode in NIR-transparent perovskite solar cell (PSC), a 17.3% steady-state power conversion efficiency and an 82% average transmittance between 820 and 1300 nm are achieved. In combination with an 18.1% CIS solar cell, a 24.6% perovskite/CIS tandem device in 4-T configuration is demonstrated. Optical analysis suggests that an amorphous IO:H film (without postannealing) and a partially crystallized IO:H film (postannealed at 150 °C), when used as a rear electrode in a NIR-transparent PSC and a front electrode in a CIS solar cell, respectively, can outperform the widely used indium-doped zinc oxide (IZO) electrodes, leading to a 1.38 mA/cm2 short-circuit current (J sc) gain in the bottom CIS cell of 4-T tandems.
Achieving high power conversion efficiencies with Cu(In,Ga)Se2 (CIGS) solar cells grown at low temperature is challenging because of insufficient thermal energy for grain growth and defect annihilation, resulting in poor crystallinity, higher defect concentration, and degraded device performance. Herein, the possibilities for high‐performing devices produced at very low temperatures (≤450 °C) are explored. By alloying CIGS with Ag by the precursor layer method, (Ag,Cu)(In,Ga)Se2 (ACIGS) solar cells grown at about 450 °C reach an efficiency of 20.1%. Only a small efficiency degradation (0.5% and 1.6% absolute) is observed for ACIGS absorbers deposited at 60 and 110 °C lower substrate temperature. CIGS devices exhibit a stronger efficiency degradation, driven by a decrease in the open‐circuit voltage (VOC). The root cause of the VOC difference between ACIGS and CIGS devices is investigated by advanced characterization techniques, which show improved morphology, reduced tail states, and higher doping density in ACIGS absorbers. The proposed approach offers several benefits in view of depositions on temperature‐sensitive substrates. Increased Cu diffusion promoted by Ag allows end‐point detection in the three‐stage process at the substrate temperatures below 300 °C. The modified process requires minimal modification of existing processes and equipment and shows the potential for the use of different flexible substrates and device architectures.
The long-term stability of electronic devices at high temperatures and electric fields might be strongly influenced by the electronic properties of interfaces. A modification of Schottky barrier heights at electrode interfaces of functional oxides upon changes of the external oxygen partial pressure is well documented in literature. In this work, an experimental approach using X-ray photoelectron spectroscopy is presented, which enables to study transient changes in the Schottky barrier height induced by electrical degradation. A rise of the Fermi level at the RuO 2 cathode interface of Fe-doped SrTiO 3 single crystals by 0.6 eV is observed in the course of resistance degradation. The change of the effective barrier height is associated to the migration of oxygen vacancies towards the cathode and accompanied by the observed reduction of Ti. Different scenarios are discussed to explain the origin of barrier modification and the localization of the reduced Ti.
The performance of Cu(In,Ga)Se2 (CIGS) solar cells is limited by the presence of the highly recombinative CIGS/Mo interface. The recombination at the CIGS/Mo interface is influential for the open circuit voltage (VOC) in high quality CIGS absorbers with increased charge carriers diffusion length. A quantitative understanding of the role of the Ga back grading height (ΔGGI) in suppressing back interface recombination is needed. In this work, we take advantage of a low temperature process to modify the ΔGGI while keeping the composition in the notch and front regions almost unchanged. Improvement in both VOC deficit and time‐resolved photoluminescence lifetime are observed with increasing ΔGGI. With a combination of back surface modification experiments and numerical simulations, we quantify a voltage loss in ungraded devices of approximately 100 mV solely from the back interface recombination. Nice agreement between simulation and experimental data is reached while constraining the values of possible diffusion lengths. Our results suggest that a ΔGGI of about 0.50 is required to effectively suppress the back interface recombination, highlighting the importance of grading control in high‐performance CIGS solar cells and devices.
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