Fast and efficient detection of the qubit state in trapped ion systems is critical for implementing quantum error correction and performing fundamental tests such as a loophole-free Bell test. In this work we present a simple qubit state detection protocol for a (171)Yb+ hyperfine atomic qubit trapped in a microfabricated surface trap, enabled by high collection efficiency of the scattered photons and low background photon count rate. We demonstrate average detection times of 10.5, 28.1, and 99.8 μs, corresponding to state detection fidelities of 99%, 99.856(8)%, and 99.915(7)%, respectively.
We trap individual 171 Yb + ions in a surface trap microfabricated on a silicon substrate, and demonstrate a complete set of high fidelity single qubit operations for the hyperfine qubit. Trapping times exceeding 20 min without laser cooling, and heating rates as low as 0.8 quanta ms −1 , indicate stable trapping conditions in these microtraps. A coherence time of more than 1 s, high fidelity qubit state detection and single qubit rotations are demonstrated. The observation of low heating rates and demonstration of high quality single qubit gates at room temperature are critical steps toward scalable quantum information processing in microfabricated surface traps.
High-efficiency collection of photons emitted by a point source over a wide field of view (FoV) is crucial for many applications. Multiscale optics offer improved light collection by utilizing small optical components placed close to the optical source, while maintaining a wide FoV provided by conventional imaging optics. In this work, we demonstrate collection efficiency of 26% of photons emitted by a pointlike source using a micromirror fabricated in silicon with no significant decrease in collection efficiency over a 10 mm object space. © 2010 Optical Society of America OCIS codes: 270.5585, 120.4820.Efficient collection of photons emitted by a point source requires an optical system with high numerical aperture (NA). It is difficult to design an optical system featuring a high NA over a wide field of view (FoV) using costeffective conventional refractive optical elements. Lens systems with NA ¼ 0:85 and a FoV of over 25 mm have been realized for lithography applications [1]. However, such optical systems utilize a large number of lens elements and suffer from optical loss, complexity, size, weight, and cost. In conventional applications, the NA of the collection optics is limited to about 0.5, corresponding to a 7% collection efficiency of photons emitted from a point source. The use of reflective and diffractive optics, like curved mirrors and Fresnel lenses [2], opens up the possibility of dramatically enhancing the photon collection efficiency. Recent experiments and proposals using trapped ions demonstrate the benefit of reflective optical elements for imaging [3], state detection, and ionphoton coupling applications [4,5]. While these approaches can dramatically increase the photon collection efficiency, macroscopic reflectors suffer from large geometric aberrations, which need to be corrected in order to distinguish light from multiple point sources. In this work, we employ a multiscale optical design [6] to increase the photon collection efficiency from a single point source, which can be extended to high-efficiency collection from an array of point sources. This design uses a single conventional objective lens and places a high NA micromirror behind each point source to allow for high-efficiency collection. The ability to image the point sources in a continuous FoV is sacrificed in exchange for high-efficiency collection from each point source in a discontinuous FoV. This way, dramatic improvements are possible in integration time and data acquisition speed for applications where image resolution is determined by the light excitation source and not by the collection optics, including determination of the internal state of a single atom [7][8][9], confocal laser scanning microscopy [10], and confocal Raman microspectroscopy [11]. The collection efficiency from each point source is determined by the high NA of the micromirror, while the number of point-source-micromirror combinations that can be measured simultaneously is determined by the FoV of the macroscopic imaging system. In our system design ( F...
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