A light-hole exciton is a quasiparticle formed from a single electron bound to a single light hole. This type of fundamental excitation, if confined inside a semiconductor quantum dot, could be advantageous in quantum information science and technology. However, it has been difficult to access it so far, because confinement and strain in conventional quantum dots favour a ground-state single-particle hole with a predominantly heavy-hole character. Here we demonstrate the creation of a light-hole exciton ground state by applying elastic stress to an initially unstrained quantum dot. Its signature is clearly distinct from that of the well-known heavy-hole exciton and consists of three orthogonally polarized bright optical transitions and a fine-structure splitting of hundreds of microelectronvolts between in-plane and out-of-plane components. This work paves the way for the exploration of the fundamental properties and of the potential relevance of three-dimensionally confined light-hole states in quantum technologies.
Numerous imaging methods have been developed over recent years in order to study materials at the nanoscale. Within this context, scanning X‐ray diffraction microscopy has become a routine technique, giving access to structural properties with sub‐micrometre resolution. This article presents an optimized technique and an associated software package which have been implemented at the ID01 beamline (ESRF, Grenoble). A structural scanning probe microscope with intriguing imaging qualities is obtained. The technique consists in a two‐dimensional quick continuous mapping with sub‐micrometre resolution of a sample at a given reciprocal space position. These real space maps are made by continuously moving the sample while recording scattering images with a fast two‐dimensional detector for every point along a rocking curve. Five‐dimensional data sets are then produced, consisting of millions of detector images. The images are processed by the user‐friendly X‐ray strain orientation calculation software (XSOCS), which has been developed at ID01 for automatic analysis. It separates tilt and strain and generates two‐dimensional maps of these parameters. At spatial resolutions of typically 200–800 nm, this quick imaging technique achieves strain sensitivity below Δa/a = 10−5 and a resolution of tilt variations down to 10−3° over a field of view of 100 × 100 µm.
The realisation of photonic devices for different energy ranges demands materials with different bandgaps, sometimes even within the same device. The optimal solution in terms of integration, device performance and device economics would be a simple material system with widely tunable bandgap and compatible with the mainstream silicon technology. Here, we show that gallium arsenide nanowires grown epitaxially on silicon substrates exhibit a sizeable reduction of their bandgap by up to 40% when overgrown with lattice-mismatched indium gallium arsenide or indium aluminium arsenide shells. Specifically, we demonstrate that the gallium arsenide core sustains unusually large tensile strain with hydrostatic character and its magnitude can be engineered via the composition and the thickness of the shell. The resulted bandgap reduction renders gallium arsenide nanowires suitable for photonic devices across the near-infrared range, including telecom photonics at 1.3 and potentially 1.55 μm, with the additional possibility of monolithic integration in silicon-CMOS chips.
Mechanical deformation of a SiGe island epitaxically grown on Si(001) was studied by a specially adapted atomic force microscope and nanofocused X-ray diffraction. The deformation was monitored during in situ mechanical loading by recording three-dimensional reciprocal-space maps around a selected Bragg peak. Scanning the energy of the incident beam instead of rocking the sample allowed the safe and reliable measurement of the reciprocal-space maps without removal of the mechanical load. The crystal truncation rods originating from the island side facets rotate to steeper angles with increasing mechanical load. Simulations of the displacement field and the intensity distribution, based on the finite-element method, reveal that the change in orientation of the side facets of about 25° corresponds to an applied pressure of 2-3 GPa on the island top plane.
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