In the field of photovoltaics, semiconductors of the III-V group such as GaAs and InP have been considered as the most efficient absorber materials due to their direct energy band gap and high mobility. In these compounds, arsenic and phosphorus are highly toxic and expensive. In this work we present systematic preparation of low cost SnS thin films and characterize these films to test their suitability for photovoltaic applications. We have observed that the films (with thickness ≅0.5μm) grown at the substrate temperature of 275°C exhibit a low resistive single SnS phase and have a direct optical band gap of 1.35eV with an absorption coefficient of ∼105cm−1. SnS films could be alternative semiconductor materials as absorbers for the fabrication of photovoltaic devices.

SnS films with different thicknesses have been deposited on glass substrates at a constant substrate temperature of 300°C . The physical properties of the films were investigated using energy dispersive analysis of X-rays, X-ray diffraction, scanning electron microscopy, atomic force microscopy, van der Pauw method, and Fourier transform infrared spectroscopy measurements at room temperature. The deposited films exhibit only SnS phase with different orientations. We show that the electrical resistivity, activation energy, and optical bandgap of the films depend strongly on the preferred orientation of the SnS films. The electrical resistivity of films decreased with the increase of film thickness. The optical and electrical data of the SnS film are well interpreted with the composition, crystal, and surface structure data.

Granular conductors form an artificially engineered class of solid state materials wherein the microstructure can be tuned to mimic a wide range of otherwise inaccessible physical systems. At the same time, topological insulators (TIs) have become a cornerstone of modern condensed matter physics as materials hosting metallic states on the surface and insulating in the bulk. However it remains to be understood how granularity affects this new and exotic phase of matter. We perform electrical transport experiments on highly granular topological insulator thin films of Bi 2 Se 3 and reveal remarkable properties. We observe clear signatures of topological surface states despite granularity with distinctly different properties from conventional bulk TI systems including sharp surface state coupling-decoupling transitions, large surface state penetration depths and exotic Berry phase effects. We present a model which explains these results. Our findings illustrate that granularity can be used to engineer designer TIs, at the same time allowing easy access to the Dirac-fermion physics that is inaccessible in single crystal systems.

The discovery of strong topological insulators led to enormous activity in condensed matter physics and the discovery of new types of topological materials. Bisumth based chalcogenides are exemplary strong three dimensional topological insulators that host an odd number of massless Dirac fermionic states on all surfaces. A departure from this notion is the idea of a weak topological insulator, wherein only certain surface terminations host surface states characterized by an even number of Dirac cones leading to exciting new physics. Experimentally however, weak topological insulators have proven to be elusive. Here, we report a discovery of a weak topological insulator (WTI), BiSe, of the Bi-chalcogenide family with an indirect band gap of 42 meV. Its structural unit consists of bismuth bilayer (Bi 2 ), a known quantum spin hall insulator sandwiched between two units of Bi 2 Se 3 which are three dimensional strong topological insulators. Angle resolved photo-emission spectroscopy (ARPES) measurements on cleaved single crystal flakes along with density fucntional theory (DFT) calculations confirm the existence of weak topological insulating state of BiSe. Additionally, we have carried out magneto-transport measurements on single crystal flakes as well as thin films of BiSe, which exhibit clear signatures of weak anti-localization at low temperatures, consistent with the properties of topological insulators.

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The photosensitivity of amorphous chalcogenide thin films brings out light-induced changes in the nonlinear and linear optical parameters upon sub-bandgap and bandgap laser irradiation.

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