Multiferroic response of nanocrystalline lithium niobate J. Appl. Phys. 111, 07D907 (2012) Non-radiative complete surface acoustic wave bandgap for finite-depth holey phononic crystal in lithium niobate Offsets of hysteresis loops along the polarization axis have been observed on a step graded Pb͑Zr,Ti͒O 3 ͑PZT͒ thin film using a Sawyer-Tower ͑ST͒ circuit. However, the same effect may be artificially reproduced by adding adequate resistors and diodes in parallel with a nongraded PZT thin film. The hypothesis that the offsets were mainly due to the asymmetrical charging up of the standard capacitor used in the ST circuit, allows us to establish that the graded ferroelectric sample behaves as a kind of rectifying device. It is concluded that the presence of asymmetrical leakage currents in compositionally graded devices may allow the elucidation of the origin of the offsets often observed in these structures. Correlatively, it is demonstrated that such offsets do not represent an abnormal static polarization but a dc voltage. The E m 4 power law dependence of the offsets ͑where E m is the amplitude of the electric field͒ was found to be attributable to the nonlinear increase of the net leakage current.

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The ferroelectric properties of Pt∕Pb(Zr0.6Ti0.4)O3∕Pt∕TiO2∕SiO2∕Si thin-film capacitors with different thicknesses are investigated. According to the literature data, tilting of the hysteresis loops and marked increase of the coercive fields are observed when the thickness of the film is reduced. The degradation of the switching properties is fully reproduced by simulations including nonferroelectric space-charge layers at both ferroelectric/electrode interfaces. Based on the theoretical results, a converse model is constructed from which the overall interface capacitance, the total interface built-in potential, and both dielectric permittivity and polarization of the bulk ferroelectric layer are determined for each film. Remarkably the polarization loop due to the switching domains, calculated for each Pb(Zr,Ti)O3 (PZT) capacitor, exhibited a squarelike shape with coercive fields in agreement with the bulk value. Moreover, a unique set of parameters was found whatever the film thickness. From our results it is concluded that the degradation of the ferroelectric properties of metal-PZT thin-film-metal capacitors, often encountered when their thickness is reduced, probably arises from a mechanism of modulation of density and sign of the space charge at both interfaces.

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An epitaxial oxygen deficient Pb(Zr0.25,Ti0.75)O3 (PZT) thin film, which presented hysteresis loop with significant shift along the electric field axis and apparent polarization suppression, is investigated. Loop deformations are studied and entirely explained, both qualitatively and quantitatively by simulations including the effect of an ultrathin interfacial layer uniformly charged. The method developed in this paper is suitable to calculate not only the polarization due to the switching domains, but also all the characteristics of the space charge layer. The determination of the linear dielectric constant of the bulk ferroelectric layer does not require preparation of films with different thicknesses, unlike most of the methods proposed to date. Linear dielectric constant and thickness of the interfacial layer are in the range εil=80–130 and dil=8–12nm, respectively. On the other hand, a very large interfacial charge concentration (Nil of few 1026m−3) is obtained. For the studied PZT sample, hysteresis deformations are not attributable to pinning of domain walls, despite the large value of Nil, but rather to the interfacial space charge layer that screens the applied electric field and prevents the full switching of the ferroelectric domains.

High quality amorphous nanolaminates by means of alternate Al2O3 and TiO2 oxide sublayers were grown with atomic scale thickness control by pulsed laser deposition. A giant dielectric constant (>10 000), strongly enhanced compared to the value of either Al2O3 or TiO2 or their solid solution, was observed. The dependence of the dielectric constant and the dielectric loss on the individual layer thickness of each of the constituting materials was investigated between 0.3 nm and 1 nm, in order to understand the prevailing mechanisms and allow for an optimization of the performances. An impedance study confirmed as the key source of the giant dielectric constant a Maxwell–Wagner type dielectric relaxation, caused by space charge polarization in the nanolaminate structure. The current work provides better insight of nanolaminates and their sublayer thickness engineering for potential applications.

The problem of thickness dependence of dielectric and ferroelectric properties of Pb͑Zr 0.54 Ti 0.46 ͒O 3 ͑PZT͒ thin film capacitors is addressed. Experimental data collected on PZT capacitors with different thicknesses and different electrode configurations, using platinum and LaNiO 3 conducting oxide, are examined within the prism of existing models. Available literature data, abounding but contradictory, led us to conclude that in the range of thickness investigated, size effect under all its aspects, i.e., increase in coercive field ͑E c ͒ as well as decrease in both dielectric permittivity and remnant polarization ͑P r ͒, result basically from existence of a depolarization field. It is shown however that the latter arises from interface chemistry, mostly related to the upper surface of the films, instead of finite screening length in the electrodes unlike commonly accepted. Moreover it is established that increase in E c and decrease in P r are not concomitant, and significant degradation of one or the other of these values strongly depends on whether a static potential, due to charged defects, is present or not at this interface.