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With rapid growth of semiconductor industry and increase in complexity of semiconductor based memory, necessity of stringent testing methodology has become one of top most criteria for memory evaluation. This paper describes the fundamental concepts and overview of Built-In-Self-Test (BIST). It describes different functional faults modeling of RAM and flash memory. This review mentions about testing approaches for memory and illustrates BIST techniques for finding faults, power dissipation, area overhead and test time during testing, also includes research gap and future scope regarding the testing of memory.

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CMOS based technologies fail to satisfy the Moore's law beyond Nano scale, leading to intensive research in identifying an alternative technology that can take over CMOS in the near future. Quantum Dot Cellular Automata (QCA) is one among the various technologies proposed by the International Technology Roadmap for Semiconductors (ITRS) as a viable alternative to CMOS. QCA offers the highest device density of 10 14 devices / cm 2 and operates at a maximum speed of T Hz. In this paper we have realized all the basic gates using multiplexers as the key element in QCA technology. Compact libraries can be designed by realizing all the basic gates using just a multiplexer.