2019
DOI: 10.17485/ijst/2019/v12i36/147752
|View full text |Cite
|
Sign up to set email alerts
|

Performance Analysis of BIST Algorithms

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2022
2022
2022
2022

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 2 publications
0
1
0
Order By: Relevance
“…Memory built-in self-test (BIST) is a technique that is very widely used for embedded memory testing. It offers several advantages such as the ability to perform self-test and selfcheck of the output responses without the use of an expensive external tester, and the ability to perform tests on multiple memories in parallel, which allow the reduction in overall test cost and test duration, respectively [8], [11]- [15]. Its efficiency in terms of the fault coverage and also the test duration depends on the test algorithm being used for its implementation [16].…”
Section: Introductionmentioning
confidence: 99%
“…Memory built-in self-test (BIST) is a technique that is very widely used for embedded memory testing. It offers several advantages such as the ability to perform self-test and selfcheck of the output responses without the use of an expensive external tester, and the ability to perform tests on multiple memories in parallel, which allow the reduction in overall test cost and test duration, respectively [8], [11]- [15]. Its efficiency in terms of the fault coverage and also the test duration depends on the test algorithm being used for its implementation [16].…”
Section: Introductionmentioning
confidence: 99%