An indirect optical method for determining size and complex refractive index of laser-damage precursors in optical materials is presented. The method is described in detail, with special attention to all assumptions. Results are given for a series of thin-film SiO 2 layers.
The described instrument is a new reflectometer designed to check the normal specular reflectance of 40,000 reflectors necessary for the Laser Megajoule (LMJ). This new reflectometer has a high accuracy over the 400-950 nm wavelength range and allows the delicate measurement of shaped parts. The measurements are relative and several reference mirrors, which are low loss dielectric mirrors [R(lambda)>99.9%], are used for the standardization. The apparatus gives an excellent repeatability (< 0.06% at 2sigma) thanks to its design and automatic focalization imaging system. After a brief review that is related to performance evolution of the spectrophotometers, our facility and its components are described. The methodology of focusing and calibration are explained. The capabilities of our device are illustrated through some measurements realized on flat or shaped samples.
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