We studied the charge storage and subsequent imaging of silicon
quantum dots (SiQD) embedded in a SiO2 film by
using atomic-force microscopy (AFM) in tapping and electrostatic
force microscopy (EFM) modes. The controllable deposition of both
positive and negative localized charges in SiQD is
described. The dynamics of the deposited charges is studied and
the charge decay time constant is determined from the
measurements. A simple analysis is presented to explain the
contrast in tapping and EFM images and to quantify the total
amount of stored charge.
We have studied theoretically the influence of adsorbate vibration on the resonant tunnelling current in STM. This study is realized by adapting the Domcke - Cederbaum formalism combined with a tight-binding approximation of the tip - adsorbate - substrate system. We have varied parametrically the bias voltage, the tip - adsorbate - substrate separations, the position of the resonant level relative to the Fermi level of the system and the vibrational energy of the adsorbate. An application to a hydrogenoid system between a tungsten tip and substrate is presented.
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