The development of integrated passive components (isolators, circulators) in the microwaves domain and particularly for the communications constitute a stake for the future years. The preparation of these components requires the deposition of ferrimagnetic thin films of some µm thickness. The characterisation methods described in the literature are well adapted on films having high permeability. The measurement loop, surrounding the film with its substrate, is sensitive to the contribution of both media. We suggest here a new technique of inductive measure considering only the characteristics of the deposited films that is surrounded alone by the measurement loop. This technique has been validated on a larger scale, preliminary measurements on thin films of barium hexaferrite and yttrium iron garnet have permitted us to establish an experimental protocol precising the limits of validity of the chosen method.
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