This article is based on a part of the first author's master's thesis from Dankook University. Objectives: The purpose of this study is to investigate whether elderly groups are able to do semantic processing during a picture-word interference task and whether their semantic processing is more affected by words in the same category or different categories. Methods: The participants in this study were 15 younger adults and 15 normal elderly. The tasks were composed of conditions where the target stimulation and distractive stimulation were in the same category or in different categories. The tasks were composed of a total of 30 questions. On the picture-word interference task, participants were supposed to name the picture. Results: The results of the study are summarized as follows. First, on the picture-word interference task, the accuracy of response of the elderly group was significantly lower than the younger group. Second, the reaction time of the elderly group was significantly slower, but both groups had a longer reaction time in the same category condition. Conclusion: The results indicated that the elderly group had more interference effects than the younger group. Although both groups resolved interference, the reaction time of the elderly group was slower. But in the same category condition, both groups had a longer reaction time than in different category conditions.
HSPICE simulations have been performed for a 16 Mb×9 SIMM memory module and the simultaneous switching noise has been investigated. The SPICE model of the SIMM memory module is made up of a PCB circuit model and a simplified DRAM chip model. To keep the SPICE simulation time within reasonable bounds, a simplified circuit model of a 16 Mb DRAM chip was generated by keeping the basic physical DRAM structure in the model including the bit-line sense amplifiers. The parameter values of the circuit elements in the simplified DRAM chip model were tuned to fit the measured transient supply current waveform of a commercial 16 Mb DRAM chip. The SIMM module was placed on a fabricated motherboard PCB and the simultaneous switching noise voltage on the motherboard VSS plane was measured. Good agreement between measurements and HSPICE simulations were observed.
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