For the determination of power losses in highvoltage direct current (HVDC) modular multilevel converters (MMC) the standards IEC 62751-1 and IEC 62751-2 demand component measurements with a sufficient uncertainty. Transient loss measurements on multilevel converter modulesso called submodules (SM) -are challenging, especially if they have to be done precisely. Measurement methods and results are rarely discussed in publications and for loss relevant datasheet values of SM components no uncertainty is given. The current work presents a HVDC test environment including two newly constructed SMs. The SM switching waveforms are analyzed in order to determine conduction and switching losses. Moreover, analyses of the measurement chain in terms of uncertainty are conducted.
Keywords-loss measurement, voltage sourced converter (VSC), modular multilevel converter (MMC), insultated gate bipolar transistor (IGBT), submodule (SM)
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