Traceability of measurement systems for the assessment of HVDC converter efficiency

Meisner, Johann; Mohns, E.; Binder, O.; Kurrat, Michael

doi:10.1109/amps.2014.6947720

Cited by 1 publication

(1 citation statement)

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“…As the VSC valves consist of semiconductor switches which are capable of high switching transients, the application of the measurement setup has to be done under terms of high frequency layout. Fundamental research on measurement system requirements have been summarized in [2].…”

Section: Introductionmentioning

confidence: 99%

HVDC test environment for loss measurements on multilevel converter modules

Binder

Meisner

Schütze

et al. 2015

2015 IEEE International Workshop on Applied Measurements for Power Systems (AMPS)

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For the determination of power losses in highvoltage direct current (HVDC) modular multilevel converters (MMC) the standards IEC 62751-1 and IEC 62751-2 demand component measurements with a sufficient uncertainty. Transient loss measurements on multilevel converter modulesso called submodules (SM) -are challenging, especially if they have to be done precisely. Measurement methods and results are rarely discussed in publications and for loss relevant datasheet values of SM components no uncertainty is given. The current work presents a HVDC test environment including two newly constructed SMs. The SM switching waveforms are analyzed in order to determine conduction and switching losses. Moreover, analyses of the measurement chain in terms of uncertainty are conducted. Keywords-loss measurement, voltage sourced converter (VSC), modular multilevel converter (MMC), insultated gate bipolar transistor (IGBT), submodule (SM)

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Section: Introductionmentioning

confidence: 99%