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The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices are more complex and extremely diverse due to the immersion of multidomains. Their failure modes are distinctive under different circumstances. Therefore, testing of these systems at device level as well as at mass production level, that is, parallel testing, is becoming very challenging as compared to the IC test, because MEMS respond to electrical, physical, chemical, and optical stimuli. Currently, test systems developed for MEMS devices have to be customized due to their nondeterministic behavior and complexity. The accurate measurement of test systems for MEMS is difficult to quantify in the production phase. The complexity of the device to be tested required maturity in the test technique which increases the cost of test development; this practice is directly imposed on the device cost. This factor causes a delay in time-to-market.

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Ahstract-Dynamic supply voltage scaling (DVS) is an efficient and practical design technique to reduce power consumption in VLSI devices. Due to the multiple volt age operating environment and the supply voltage depen dent behavior of physical faults, obtaining a minimal test set which gives the best fault coverage is challenging. Re searchers have showed that testing of resistive opens is best achieved at high supply voltage. However based on our ex perimental results on ISCAS-85 circuits it is shown that is not always the case for DVS enabled designs. This paper analyzes and identifies different detectability patterns for resistive open faults in such designs. Additionally it dis cussed the multi-VDD testing and its necessity to achieve 100% fault coverage.

Recent years have seen rapid progress in using digital microfluidics based biochips for biomedical assays. The testing and reliability of these biochips is crucial when they are used in point-of-care diagnostics applications. As the scalability and complexity of biomedical assays increases, there is a need for efficient testing methodologies to ensure reliability of these biochips. The conventional testing methodologies will not be sufficient for the recently proposed and highly scalable Micro-electrode-dot array (MEDA) architecture based digital microfluidics. This is because of the advanced fluidic movement operations incorporated in the MEDA architecture. This paper investigates the testing methodologies for conventional digital microfluidics based biochips and their relevancy to the MEDA architecture based digital microfluidics biochips.