The thermomechanical motion imposes the fundamental noise limit in room-temperature resonant sensors and oscillators. Due to the inherently low sensitivity of capacitive transduction in microelectromechanical (MEM) resonators, its effects are often masked by noise in the subsequent amplifier and measurement stages. In this work, we demonstrate a capacitive transduction scheme for measuring kHz-MHz frequency MEM resonators across 1 µm capacitive gaps with 99.8% thermomechanical-noise-limited resolution. We delineate the transimpedance gain and noise of our custom off-chip differential transimpedance amplifier setup. The thermomechanical noise spectrum can provide estimates of the resonant frequency, quality factor, and electromechanical transduction factor comparable to the commonly used driven response, without the downsides of capacitive feedthrough or nonlinearity.
Sensitive capacitive transduction of micromechanical resonators can contribute significant electrical dissipation, which degrades the quality factor of the eigenmodes. We theoretically and experimentally demonstrate a scheme for isolating the electrical damping of a mechanical resonator due to Ohmic dissipation in the readout amplifier. The quality factor suppression arising from the amplifier is strongly dependent on the amplifier feedback resistance and parasitic capacitance. By studying the thermomechanical displacement noise spectrum of a doubly clamped micromechanical beam, we confirm that electrical dissipation tunes the actual, not effective, quality factor. Electrical dissipation is an important consideration in the design of sensitive capacitive displacement transducers, which are a key component in resonant sensors and oscillators.
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