The goal of this paper was to investigate the antifungal activity of Enamel layers deposited on titanium substrate (Ti-Enamel) and Enamel layers deposited on titanium substrate previously coated with a vinyl polydimethylsiloxane layer (Ti-PDMS-Enamel). The physicochemical properties were also investigated. TheCandida albicansbiofilm development on the obtained layers was examined after 24 h, 48 h, and 72 h by confocal laser scanning microscopy (CLSM) and scanning electron microscopy (SEM) after ethidium bromide staining. A significant inhibition of the fungal adherence and biofilm development was observed on Ti-Enamel layers. The antifungal results demonstrated that the use of new Ti-Enamel composite layers could represent a promising perspective for the prevention of fungal biofilms associated implant infections.
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