The change of phase upon reflection at an air/film interface, beta , for dielectric and slightly absorbing films is shown to be an experimental parameter sensitive to both film thickness and optical constants. High sensitivities are found at film thicknesses where (n1d/ lambda ) approximately=0.5. For selenium a change of 1 degrees in beta would result from Delta n1=0.004 and Delta d approximately=1.5 AA. For Se films the real part of n1-n1-ik1 is obtained experimentally with an uncertainty of 1.4%.
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