In this paper, we propose an EMI (Electromagnetic Interference) reduction technique by employing a conductive connection between frames. Several cconductors were used to connect two frames, which might provide another return path of signal current loop, and reduce the DM (Differential Mode) radiation from the cable. To prove the effectiveness of the conductor connection, we investigated two cases: (1) without any conductor below cable, (2) installing three different conductors of small, medium, and large sized-conductors. The results were obtained from both measurement and full-wave simulation, and we observed that EMI decreased about 1 to 10 ㏈㎶ in the frequency range from 30MHz to 1GHZ.
We have developed an electromagnetic (EM) wave propagation theory through a single layer and multiple layers in the near-field and far-field regions, and have constructed a matrix formalism in terms of the boundary conditions of the EM waves. From the shielding efficiency (SE) against EM radiation in the near-field region calculated by using the matrix formalism, we propose that the effect of multiple layers yields enhanced shielding capability compared to a single layer with the same total thickness in conducting layers as the multiple layers. We compare the intensities of an EM wave propagating through glass coated with conducting indium tin oxide (ITO) on one side and on both sides, applying it to the electromagnetic interference (EMI) shielding filter in a flat panel display such as a plasma display panel (PDP). From the measured intensities of EMI noise generated by a PDP loaded with ITO coated glass samples, the two-side coated glass shows a lower intensity of EMI noise compared to the one-side coated glass. The result confirms the enhancement of the SE due to the effect of multiple layers, as expected in the matrix formalism of EM wave propagation in the near-field region. In the far-field region, the two-side coated glass with ITO in multiple layers has a higher SE than the one-side coated glass with ITO, when the total thickness of ITO in both cases is the same.
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