“…Considering a constant increase of integration densities, having a possibility of performing fast and accurate system-level simulations in an early design stage and optimizing its performance is of increasing importance. Connectors are typically modeled by multisegment lumpedelements as in [1], [3]- [7] or multisegment transmission lines as in [8]- [10]. In all of these papers, the model parameters are fitted to the measured data, either the S-parameter measurements as in [3], the time-domain reflectometry (TDR) as in [4], [6]- [9], or both as in [1] and [5].…”