Timing walk error in pulsed time-of-flight based laser range finding was studied using two different types of laser diode drivers. The study compares avalanche bipolar junction transistor (BJT) and metal-oxide-semiconductor field-effect transistor switch based laser pulse drivers, both producing 1.35 ns current pulse length (full width at half maximum), and investigates how the slowly rising part of the current pulse of the avalanche BJT based driver affects the leading edge timing walk. The walk error was measured to be very similar with both drivers within an input signal dynamic range of 1:10 000 (receiver bandwidth of 700 MHz) but increased rapidly with the avalanche BJT based driver at higher values of dynamic range. The slowly rising part does not exist in the current pulse produced by the metal-oxide-semiconductor (MOS) based laser driver, and thus the MOS based driver can be utilized in a wider dynamic range.
This study presents a CMOS receiver chip realized in 0.18 µm High-Voltage CMOS (HV-CMOS) technology and intended for high precision pulsed time-of-flight laser range finding utilizing high-energy sub-ns laser pulses. The IC chip includes a trans-impedance preamplifier, a post-amplifier and a timing comparator. Timing discrimination is based on leading edge detection and the trailing edge is also discriminated for measuring the width of the pulse. The transimpedance of the channel is 25 kΩ, the uncompensated walk error is 470 ps in the dynamic range of 1:21,000 and the input referred equivalent noise current 450 nA (rms).
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