The Ag-In-Sb-Te system is widely used for phase-change discs such as compact disc rewritable (CD-RW) and rewritable digital versatile disc (DVD+RW). To clarify the effect of Ag and In in the Ag-In-Sb-Te system, we studied the local structure of Ag-In-Sb-Te phase-change material by extended X-ray absorption fine structure (EXAFS). The results suggest that the existence of Ag contributes to the thermal stability of amorphous marks and existence of In contributes to high-speed phase-change.
We studied phase-change recording using a 405 nm blue
laser diode, an objective lens of numerical aperture (NA)=0.6 and Ag–In–Sb–Te phase-change material. We report land and groove recording on a conventional disk structure with a 0.6-mm-thick and
120-mm-diameter PC substrate. We confirmed the possibility of achieving a high density, 12 GB capacity and a high data-transfer
rate of 30 Mbps, corresponding to that of a read-only digital
versatile disk (DVD-ROM) under the conditions of 6.5 m/s recording
speed, 0.18 µm/bit linear density (minimum mark length
0.27 µm) and 0.42 µm trackpitch.
The feasibility of using Ag–In–Sb–Te phase change material for high density of directly overwritable optical discs has been studied. A linear density of 0.34 µm/bit with a track pitch of 0.74 µm is confirmed to be achievable with a light source wavelength of 680 nm, with an objective lens NA of 0.60 and the criteria of data-to-data jitter of less than 14% of the channel bit length. The recording characteristics are also studied using an optical system with a 635 nm red laser diode in order to investigate the attainment of a linear density of 0.267 µm/bit which is equivalent to the DVD-ROM (read only memory) specification.
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