The Luminescent Solar Concentrator (LSC) consists of a transparent polymer plate, containing luminescent particles. Solar cells are connected to one or more edges of the polymer plate. Incident light is absorbed by the luminescent particles and re-emitted. Part of the light emitted by the luminescent particles is guided towards the solar cells by total internal reflection. Since the edge area is smaller than the receiving one, this allows for concentration of sunlight without the need for solar tracking. External Quantum Efficiency (EQE) and current-voltage (I-V) measurements were performed on LSC devices with multicrystalline silicon (mc-Si) or GaAs cells attached to the sides. The best result was obtained for an LSC with four GaAs cell power conversion efficiency of this device, as measured at European Solar Test Installation laboratories, was 7.1% (geometrical concentration of a factor 2.5). With one GaAs cell attached to one edge only, the power efficiency was still as high as 4.6% (geometrical concentration of a factor 10). To our knowledge these efficiencies are among. the highest reported for the LSC
This paper presents a review on crystalline silicon bifacial PV performance characterisation and simulation to facilitate new research developments for bifacial PV technology and implementation in the global market.
Multijunction photovoltaic (PV) thin-film modules are becoming more and more important on the market, due to their low cost and improved module efficiency now well above 10%. The spectral response (SR) measurement of multijunction thin-film cells presents additional challenges with respect to the SR measurement procedure for single-junction devices. Several works have appeared in the last 15 years in the PV literature, describing certain measurement artefacts that typically appear when measuring the SR of multijunction cells without applying an appropriate voltage bias to the entire cell. In this paper, the authors revise the theoretical description of SR measurements on multijunction devices, show how to detect the possible origin of measurement artefacts from the dark SR and show why bias voltage sometimes is not enough to avoid such artefacts or why it is not even necessary. An experimental confirmation of the theoretical approach is finally given.
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