Semiconductor lasers are the most efficient manmade narrow-band light sources and convert up to threequarters of electric energy into light. High-power diode lasers are characterized by very high internal power densities in their small cavity, resulting in local heating and sometimes device degradation. Catastrophic optical damage (COD) of diode lasers is a relevant degradation mechanism and limit for reaching ultrahigh optical powers. An overview is given on research activities targeting the mechanisms being relevant for the COD process in GaAs-based diode lasers emitting in the 630-1100 nm range. The discussion of experiments, where COD is artificially provoked, represents the main topic. The sequence of events and fast kinetics taking place on a nanosecond to microsecond time scale are addressed. A particular emphasis is laid on recent experimental work performed in the authors' laboratories. Paving the way for knowledge-based solutions towards more robust diode lasers represents the ultimate goal of this work. COD diagram determined for a batch of broad-area AlGaAs diode lasers. The time to COD within a single current pulse is plotted versus the actual average optical power in the moment when the COD takes place. Full circles stand for clearly identified COD events (right ordinate), whereas open circles (left ordinate) represent the pulse duration in experiments, where no COD has been detected. A borderline (gray) exists between two regions, i. e., parameter sets, of presence (orange) and absence of COD (blue). This borderline is somewhat blurred because of the randomness in filamentation of the laser nearfield and scatter in properties of the involved individual devices.
We present an analysis of the catastrophic optical damage effect that is artificially provoked in 808 nm emitting broad area diode lasers by single current pulses. The kinetics of the sudden degradation process, monitored with a nanosecond temporal resolution, is linked to the damage pattern observed. This involves in situ tracing of emission power and hot-spot motion within the cavity as well as the verification of the resulting defects by defect spectroscopy and cathodoluminescence mapping. A complementary model is presented which explains the shape of the observed defect pattern. The combination of unidirectional energy transfer to defects by laser light within the laser cavity, spatially isotropic defect growth, and the presence of shadowing effects explain the complex damage pattern observed in the gain material, including effects of defect branching. The study is made with standard industrial devices making the findings directly applicable for device testing and performance improvements.
The propagation of defect networks in failed 980 nm emitting high‐power diode lasers is analyzed. This is accomplished ex post facto by electron‐beam based techniques applied without device preparation and in situ by thermographic microscopy with 1 µs time resolution. Moreover, an iterative model is established, which allows for describing both the shape of the observed defect networks as well as the kinetics of their spread. This concerted approach allows the clear assignment of starting points of extended defect systems as well as analysis of their evolution kinetics. Eventually this knowledge may help in making devices more resistive against defect creation and extension.
Single-pulse tests of the catastrophic optical damage (COD) are performed for three batches of diode lasers with different gain-regions. The tests involve in situ inspection of front, rear, and side of the devices by a thermocamera. Devices with an Al-containing gain-region show COD at the front facet, as expected for strong facet heating via surface recombination and reabsorption of laser light. In contrast, Al-free devices with low surface recombination rates tend to fail at the rear facet, pointing to a different heating scenario. The high carrier density at the rear facet favors heating and COD via Auger recombination processes.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.