ResumoO presente trabalho tem como objetivo promover, através da técnica de elipsometria, a caracterização de propriedades ópticas e dielétricas do nióbio metálico e, além disto, medir a espessura dos filmes finos de óxido de nióbio formados. Devido a grande variedade de aplicações em importantes setores, o nióbio se tornou um elemento de grande importância para o desenvolvimento tecnológico em áreas estratégicas e o Brasil destaca-se neste contexto por deter as maiores reservas mundiais. Logo, conhecer o máximo de informações sobre este material é de grande importância para direcionar estudos às aplicações tecnológicas a fim de se agregar valor ao nióbio e seus compostos. Após a realização das medidas de parâmetros elipsométricos, e modelagem apropriadas, foram geradas satisfatoriamente as propriedades ópticas e dielétricas do material. Sendo também medida a espessura do óxido formado de forma natural sobre o substrato de nióbio metálico. Palavras-chave: Nióbio; Óxido de nióbio; Elipsometria. ELLIPSOMETRIC CHARACTERIZATION OF METALLIC NIOBIUM AbstractThis study aims to promote, through the ellipsometry technique, the characterization of metallic niobium optical and dielectric properties and, in addition, to measure the formed thin niobium oxide films thickness. Due to the wide variety of applications in important sectors, niobium has become an element of great significance to the technological development in strategic areas and Brazil stands out in this context by detaining the largest reserves. Therefore, to know as much information as possible about this material is of great importance to direct researches to technological applications in order to add value to the niobium and its compounds. After the achievement of ellipsometry measurements and modelling, it has been satisfactorily generated the optical properties of the material. And also measured the thickness of the naturally formed oxide on niobium metal substrate.
ResumoNeste trabalho é apresentado uma metodologia para caracterização de propriedades ópticas e espessura de óleo depositado em folha-de-flandres por elipsometria. Folhas-de-flandres precisam receber ao final do seu processo de produção um fino filme de óleo para proteger a folha contra abrasão e facilitar o desempilhamento quando é armazenada em fardos. Para medida da espessura desta camada de óleo foi desenvolvido um procedimento eficaz com o uso de um Elipsômetro Espectrométrico (ou Espectral) de Polarizador Rotativo. Foram comparados os resultados com estudos feitos pelo método da balança de hidrofil, técnica utilizada atualmente, mostrando um aumento na sensibilidade da medida. Palavras-chave: Folhas-de-flandres; Filme de óleo; Elipsometria espectral. ELLIPSOMETRIC CHARACTERIZATION OF OIL IN TINPLATES AbstractIn this work present a methodology for characterizing optical properties and deposited oil thickness in tinplates is presented. Tinplates need to receive at the end of the manufacturing process a thin filme of oil in order to protect it from marring. In order to monitor oil thickness it was developed an effective procedure by means of a Rotating Polarizer Spectral Ellipsometer. Our results were compared with the actual procedure results that uses a hydrophil balance method, and our method presents better accuracy.
Ellipsometry is a non-destructive and indirect technique able to characterize both optical and dielectric properties of thin films and bulks, besides determining the thickness of thin films. This characterization is performed by evaluating the change in the polarization state of the incident light when it interacts with the material of interest. In this work, the ellipsometry technique was used to characterize optical properties of AZ31 magnesium alloy samples. This alloy has several interesting properties such as low density, high thermal conductivity, good machinability, among others, which makes it suitable for use in automotive and aerospace components. However, when this alloy is exposed to ambient atmosphere, it undergoes natural oxidation, developing a surface film of oxides and/or hydroxides. This study aimed to establish an efficient methodology for accessing the optical and dielectric characteristics of the substrate (AZ31 alloy) as well as those for the surface film of oxide/hydroxides, and to obtain the thickness of this film. Four samples mechanically grinded and polished were investigated: One sample, namely P sample, was subjected to the ellipsometric measurements immediately after grinding and polishing and three samples, namely A10, A50 and A60, were exposed to the air at 150°C during 10, 50 e 60 minutes, respectively. From the results of the ellipsometric measurements for P sample, it was possible to determine the refractive index (n) and extinction coefficient (k) curves as a function of the wavelength (λ) for the substrate (AZ31 alloy). Besides, through appropriate modeling, it was possible to determine the thicknesses of the oxides/hydroxides films presented in A10, A50 and A60 samples. The thicknesses values obtained seem to be quite coherent when we analyze the surface roughness of these samples using the confocal microscope, validating the optical model constructed to represent the A10, A50 and A60 samples. The results achieved in this study can contribute to the study of both of oxides/hydroxides layers growth and protective coating films growth for AZ31 magnesium alloy.
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