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Magnetoresistive Sr 2 FeMoO 6 thin films were grown by pulsed laser deposition at optimized deposition atmosphere and temperature. Films were then ex situ postannealed in different atmospheres and by vacuum annealing at temperatures between 500°C and 1100°C. Ar and air annealed samples were destroyed by ex situ post-annealing treatment, due to formation and dominance of SrMoO 4 impurity phase. X-ray diffraction showed no impurities and full texturation of vacuum and ArH 2 (5%) annealed samples. Those samples showed also similar magnetic and magnetoresistive behavior like as-deposited sample. Neither magnetic, magnetotransport nor structural properties could be improved by ex situ post-annealing treatments.