The usefulness of heavy-ion forWard scattering coincidence measurements is demonstrated for the detection of low-mass impurity atoms in thin self-supporting nickel and gold films. Oxygen beams of 15-20 MeV have been used to detect 16 0 and 24Mg atoms in nickel films :::;200 J-tg cm-2 thick and chlorine beams of 40 Me V to detect 39K and 63CU atoms in gold films :::; 350 J-tg cm -2 thick. The detection sensitivity and mass discrimination are functions of the angle of acceptance of the detectors. Impurity atom concentrations of the order 10 14 atoms cm-2 are detectable. Depth information is available from the energy spectra. Possible application of the detection technique to the determination of the lattice site of low-mass impurities, by channeling in thin single crystals, is considered.[This article is copyrighted as indicated in the article. Reuse of AIP content is subject to the terms at: http://scitation.aip.org/termsconditions. Downloaded to ] IP: 193.0.65.67 On: Wed, 03 Dec 2014 15:50:22
Channeling of 1-MeV He+ ions in NaCl has been studied over the temperature range 77 -870 K. The rate of damage by the He+ ions at 77 and 300 K was measured. A previously unobserved reduction in g;"occurred at ion doses &5)&10" ions/cm'. Measured g;"((100). ) values for undamaged NaCl were 2% at 77 K rising to 10% at 870 K. These are the first quantitative g;"data for He+ ion channeling in NaCl.
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