Electron diffraction measurements on (100) GaAs1−xSbx layers with x≊0.5 grown by organometallic vapor phase epitaxy indicate that ordered phases are formed during growth. Two ordered phases are observed. The simple, tetragonal AuCu-I type phase consists of alternating {100} oriented GaAs and GaSb layers. Only the two variants with the tetragonal c axes perpendicular to the growth direction are observed. At least two variants are observed for the chalcopyrite E11 structure with alternating {210} oriented GaAs and GaSb layers.

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The pseudobinary III/V system GaAs1−ySby is well known to have a solid phase miscibility gap with a critical temperature of 751 °C. We have succeeded in growing epitaxial layers of GaAs0.5Sb0.5 lattice matched to InP at temperatures of 600 and 630 °C using the organometallic vapor phase epitaxy technique. The key requirement is a III/V ratio of greater than unity. This leads to the incorporation of all As and Sb reaching the interface and the ability to grow metastable alloys. The epitaxial GaAs0.5Sb0.5 layers have excellent surface morphology and efficient photoluminescence at a wavelength of 1.6  μm.

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