Abstract. Nine european national metrology institutes (NMIs) are collaborating in a new project funded by the european metrology research programme (EMRP) to establish traceable dynamic measurement of the mechanical quantities force, pressure, and torque. The aim of this joint research project (JRP) is to develop appropriate calibration methods, mathematical models, and uncertainty evaluation. The duration of the project is 3 years for a global amount of e3.6 million. It began in September 2011.
New materials are of key importance for scaling memories in the sub 50 nm generations. Currently high‐k materials and metal gates are investigated for usage in Flash and DRAM memory. However, the requirements in the applications are different, leading to different material combinations. This paper gives an overview on new materials with focus on memory applications.
This article presents a newly at PTB developed dynamic bridge standard for frequency dependent calibration of strain gauge and piezo-resistive bridge amplifiers. The bridge standard operates in a ratiometric mode by picking up the dc bridge supply voltage which is provided by the bridge amplifier under calibration. The sinusoidal or arbitrary calibration signal, the output voltage of the bridge standard, is generated by multiplying digital-to-analogue converters in combination with a resistive voltage divider. Additionally a reference signal is provided for phase calibration. The bridge standard provides the ability of static and dynamic strain gauge bridge amplifier amplitude and phase calibration in the frequency range from up to 10 kHz. The provided frequency range covers a wide range of industrial measurements of dynamic mechanical quantities such as dynamic force, torque, and pressure.Index Terms -Dynamic bridge standard system, strain gauge bride amplifiers, electrical measurements of mechanical quantities.
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