This paper reports on the extension of the reverse-magnetic-field reciprocity (RMFR) principle to electrically linear devices with arbitrary shape and extended contacts. The RMFR principle is a consequence of Onsager’s relation for the conductivity tensor depending on the magnetic field. It states the identity of resistance measurements on linearly conductive four-contact samples in a magnetic field B upon contact switching and magnetic field reversal. The previously available proof was restricted to samples with pointlike contacts and thus did not directly apply to real devices. Implications for two-contact and three-contact structures, for planar and symmetric devices, and the use of the structures as magnetic sensors are discussed. Experimental results obtained with complementary metal oxide semiconductor test structures of different geometries are in excellent agreement with the theoretical findings.
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