Ordered silicon nanocones arrays for label-free DNA quantitative analysis by surface-enhanced Raman spectroscopy Appl. Phys. Lett. 99, 153116 (2011); 10.1063/1.3650937Label-free detection of oligonucleotide microarrays by oblique-incidence reflectivity difference method

We present a promising approach for the label-free characterization of genetic material. Time-resolved terahertz (THz) transmission analysis of polynucleotides demonstrate a strong dependence of the complex refractive index on the binding state (hybridized/denatured) of deoxyribonucleic acid (DNA) molecules. By monitoring THz transients, one can thus infer the binding state of oligo- and polynucleotides, and hence identify polynucleotides by detecting the binding of unknown polynucleotide DNA sequences to known probe molecules. A broadband experimental demonstration in a free-space configuration, as well as a discussion of the potential application for next generation gene chips is presented.

Low-loss high dielectric-constant materials are analyzed in the terahertz frequency range using time-domain spectroscopy. The dielectric constant and loss tangent for steatite, alumina, titania loaded polystyrene, and zirconium-tin-titanate are presented and compared to measurements on high-resistivity silicon. For these materials, the real part of the dielectric constant ranges from 6 to 90. All of the samples were found to have reasonable low-loss tangents. Applications as photonic crystal substrates for terahertz frequency antenna are envisaged.