International audienceThis paper examines aspects of design technology required to explore advanced logic-circuit design using carbon nanotube field-effect transistor (CNTFET) devices. An overview of current types of CNTFETs is given and highlights the salient characteristics of each. Compact modeling issues are addressed and new models are proposed implementing: 1) a physics-based calculation of energy conduction sub-band minima to allow a realistic analysis of the impact of CNT helicity and radius on the dc characteristics; 2) descriptions of ambipolar behavior in Schottky-barrier CNTFETs and ambivalence in double-gate CNTFETs (DG-CNTFETs). Using the available models, the influence of the parameters on the device characteristics were simulated and analyzed. The exploitation of properties specific to CNTFETs to build functions inaccessible to MOSFETs is also described, particularly with respect to the use of DG-CNTFETs in fine-grain reconfigurable logic
This paper focuses on the EM induced voiding in a line ended by a TSV, and proposes an analytical model based on the link between the monitored electrical resistance increase and the matter depletion flow.
ISBN: 0769505376IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supply and speed. By approaching these limits, circuits are becoming increasingly sensitive to noise, which will result in unacceptable rates of soft-errors. Furthermore, defect behavior is becoming increasingly complex resulting in increasing number of timing faults that can escape detection by fabrication testing. Thus, fault tolerant techniques will become necessary even for commodity applications. This work considers the implementation and improvements of a new soft error and timing error detecting technique based on time redundancy. Arithmetic circuits were used as test vehicle to validate the approach. Simulations and performance evaluations of the proposed detection technique were made using time and logic simulators. The obtained results show that detection of such temporal faults can be achieved by means of meaningful hardware and performance cost
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