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The fabrication and electrochemistry of a new class of graphene electrodes are presented. Through high-temperature annealing of hydrazine-reduced graphene oxides followed by high-speed centrifugation and size-selected ultrafiltration, flakes of reduced graphene oxides (r-GOs) of nanometer and submicrometer dimensions, respectively, are obtained and separated from the larger ones. Using n-dodecanethiol-modified Au ultramicroelectrodes of appropriately small sizes, quick dipping in dilute suspensions of these small r-GOs allows attachment of only a single flake on the thiol monolayer. The electrodes thus fabricated are used to study the heterogeneous electron transfer (ET) kinetics at r-GOs and the nanoscopic charge transport dynamics at electrochemical interfaces. The r-GOs are found to exhibit similarly high activity for electrochemical ET reactions to metal electrodes. Voltammetric analysis for the relatively slow ET reaction of Fe(CN)6(3-) reduction produces slightly higher ET rate constants at r-GOs of nanometer sizes than at large ones. These ET kinetic features are in accordance with the defect-dominant nature of the r-GOs and the increased defect density in the nanometer-sized flakes as revealed by Raman spectroscopic measurements. The voltammetric enhancement and inhibition for the reduction of Ru(NH3)6(3+) and Fe(CN)6(3-), respectively, at r-GO flakes of submicrometer and nanometer dimensions upon removal of supporting electrolyte are found to significantly deviate in magnitude from those predicted by the electroneutrality-based electromigration theory, which may evidence the increased penetration of the diffuse double layer into the mass transport layer at nanoscopic electrochemical interfaces.

Redox cycling in nanometer-wide thin-layer cells holds great promise in ultrasensitive voltammetric detection and in probing fast heterogeneous electron-transfer kinetics. Quantitative understanding of the influence of the nanometer gap distance on the redox processes in the thin-layer cells is of crucial importance for reliable data analysis. We present theoretical consideration on the voltammetric behaviors associated with redox cycling of electroactive molecules between two electrodes separated by nanometer widths. Emphasis is placed on the weakness of the commonly used Butler-Volmer theory and the classic Marcus-Hush theory in describing the electrochemical heterogeneous electron-transfer kinetics at potentials significantly removed from the formal potential of redox moieties and, in addition, the effect of the electric-double-layer on the electron-transfer kinetics and mass transport dynamics of charged redox species. The steady-state voltammetric responses, obtained by using the Butler-Volmer and Marcus-Hush models and that predicted by the more realistic electron-transfer kinetics formulism, which is based on the alignments of the density of states between the electrode continuum and the Gaussian distribution of redox agents, and by inclusion of the electric-double-layer effect, are compared through systematic finite element simulations. The effect of the gap width between the electrodes, the standard rate constant and reorganization energy for the electron-transfer reactions, and the charges of the redox moieties are considered. On the basis of the simulation results, the reliability of the conventional voltammetric analysis based on the Butler-Volmer kinetic model and diffusion transport equations is discussed for nanometer-wide thin-layer cells.

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