Nanoripple patterns with long-range order have been fabricated on amorphous dielectric films by Xe + ion etching. They are used as templates to elaborate organized arrays of aligned Ag nanoparticles by grazing incidence ion-beam sputtering. The particles present an ellipsoidal shape with a major axis parallel to the ripples. Optical calculations show that both the spatial organization and shape anisotropies contribute to a strong dependence of the surface-plasmon resonance of the nanocomposite films on the orientation of the electric field.
The effects of size, shape and organization on the surface plasmon resonances of Ag nanoclusters sandwiched between Si(3)N(4) layers are studied by transmission electron microscopy and anisotropic spectroscopic ellipsometry. We present an easy-to-handle model that quantitatively links the nanostructure and optical response of the films, which are considered as dielectric/metal:dielectric/dielectric trilayers, with the central nanocomposite layer being an effective medium whose optical properties are described by an anisotropic dielectric tensor. The components of this tensor are calculated using a generalization of the Yamaguchi theory taking into account the real organization, size and shape distributions of ellipsoidal nanoclusters, whose electronic properties are assumed to reflect shape-dependent finite size effects. Using this model, it is shown that the optical response of the films in the visible range is dominated by the excitation of the surface plasmon resonance of the clusters along their in-plane long axis, while no surface plasmon resonance resulting from an excitation along their in-plane short axis can be observed due to damping effects. Moreover, the spectral position of this resonance appears to be mainly affected by the average shape of the clusters, and weakly by their size, their shape distribution and the electromagnetic interaction between them.
Fiber-optics reflectance spectroscopy is used to identify pigments in pictorial layers of works of art thanks to a spectra database of dry powdered mineral pigments. Measurements are noninvasive, without any contact, and can be implemented in situ, without moving the work of art under investigation from its conservation place. The experimental device, using the special back-scattering configuration, is briefly presented. The protocol leading to the constitution of the spectra database of dry mineral pigments is described. Unlike other studies, this protocol has been developed to emphasize multiple scattering of light by elementary pigments in comparison with specular reflection on the surface of the sample. In these conditions, the diffuse reflectance spectrum is the label of the mineral pigment. The numerical processing of pigment identification is detailed. Both the influences of the roughness of the studied surface and of a possible varnish layer are taken into account when numerical identification is implemented. Several applications on patrimonial works of art are reported.
Abstract:To assess the accuracy of virtual cleaning of Old Master paintings (i.e. digital removal of discolored varnishes), a physical model was developed and experimentally tested using reflectance imaging spectroscopy on three paintings undergoing conservation treatment. The model predicts the reflectance spectra of the painting without varnish or after application of a new varnish from the reflectances of the painting with the aged varnish, given the absorption of the aged varnish and the scattering terms. The resulting color differences between the painting actually and virtually cleaned can approach the perceivable limit. Residual discrepancies are ascribable to spatial variations in the characteristics of the aged varnish (scattering, optical thickness) and the exposed painting (surface roughness).
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The Volmer-Weber growth of high-mobility metal films is associated with the development of a complex compressive-tensile-compressive stress behavior as the film deposition proceeds through nucleation of islands, coalescence, and formation of a continuous layer. The tensile force maximum has been attributed to the end of the islands coalescence stage, based on ex situ morphological observations. However, microstructural rearrangements are likely to occur in such films during post-deposition, somewhat biasing interpretations solely based on ex situ analysis. Here, by combining two simultaneous in situ and real-time optical sensing techniques, based on surface differential reflectance spectroscopy (SDRS) and change in wafer curvature probed by multibeam optical stress sensor (MOSS), we provide direct evidence that film continuity does coincide with tensile stress maximum during sputter deposition of a series of metal (Ag, Au, and Pd) films on amorphous SiOx. Stress relaxation after growth interruption was testified from MOSS, whose magnitude scaled with adatom mobility, while no change in SDRS signal could be revealed, ruling out possible changes of the surface roughness at the micron scale.
We calculate, in the quasistatic coupled dipole approximation, the analytical expressions of the effective dielectric tensor of a single layer of polydisperse ellipsoidal nanoparticles with two of their principal axes in the layer's plane and embedded in a homogeneous dielectric medium. The organization (isotropic or anisotropic) and orientation (without or with a preferential in-plane orientation) of the nanoparticles is taken into account, together with their (possibly correlated) in-plane size, in-plane projected shape, and height distributions. In particular, we propose to describe the response of a layer of nanoparticles presenting a height distribution by using a vertically graded effective medium model. The expressions are tested in the case of finely characterized dielectric/silver/dielectric granular trilayers grown by means of vapor deposition in which the silver coalesced nanoparticles present correlated in-plane size and in-plane projected shape/height distributions and a moderate surface coverage of about 25%. A satisfactory quantitative agreement is obtained between the simulated and measured surface plasmon extinction bands of the metal nanoparticles. This agreement is permitted by the capability of the effective medium model of taking into account the ellipsoidal shape of the nanoparticles. The significant role of the size and shape distributions is also demonstrated.
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