We show direct experimental evidence that radiation effects produced by single MeV heavy ions on a polymer surface are weakened when the length of the ion track in the material is confined into layers of a few tens of nanometers. Deviation from the bulk (thick film) behavior of ion-induced craters starts at a critical thickness as large as ∼40 nm, due to suppression of long-range additive effects of excited atoms along the track. Good agreement was found between the experimental results, molecular dynamic simulations, and an analytical model.

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In this paper, the surface effects of individual heavy ions impacting thin polymerlike films were investigated, using molecular dynamics simulations with the finite extensible nonlinear elastic (FENE) potential to describe the molecular chains. The perturbation introduced by the ions in the lattice was modeled assuming that the initial excitation energy in the ion track is converted into an effective temperature, as in a thermal spike. The track was heated only within the film thickness h, leaving a nonexcited substrate below. The effect of decreasing thickness on cratering and sputtering was evaluated. The results were compared to experimental data of thin polymer films bombarded by MeV-GeV ions and to simulations performed with the Lennard-Jones potential. While several qualitative results observed in the experiments were also seen in the simulations, irrespective of the potential used, there are important differences observed on FENE films. Crater dimensions, rim volume, and sputtering yields are substantially reduced, and a threshold thickness for molecular ejection appears in FENE simulations. This is attributed to the additional restrictions on mass transport out of the excited track region imposed by interchain interactions (entanglements) and by the low mobility of the molten phase induced by the spike.CNPq CAPES (Brazil) Fondo Nacional de Investigaciones Cientificas y Tecnologicas (FONDECYT, Chile) 3140526 Financiamiento Basal para Centros Cientificos y Tecnologicos de Excelencia FB-0807 (ANPCyT), a SeCTyP-UN Cuyo grant 18352/R0 1868

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This chapter presents a specific reliability study of some GEANT4-DNA (version 10.02.p01) processes and models for proton transportation considering ultra-thin layers (UTL). The Monte Carlo radiation transport validation is fundamental to guarantee the simulation results accuracy. However, sometimes this is impossible due to the lack of experimental data and, it is then that the reliability evaluation takes an important role. Geant4-DNA runs in an energy range that makes impossible, nowadays, to perform a proper microscopic validation (cross-sections and dynamic diffusion parameters) and allows very limited macroscopic reliability. The chemical damage cross-sections reliability (experiment versus simulation) is a way to verify the consistency of the simulation results which is presented for 2 MeV incident protons beam on PMMA and PVC UTL. A comparison among different Geant4-DNA physics lists for incident protons beams from 2 to 20 MeV, interacting with homogeneous water UTL (2 to 200 nm) was performed. This comparison was evaluated for standard and five other optional physics lists considering radial and depth profiles of deposited energy as well as number of interactions and stopping power of the incident particle.

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