We have fabricated Cu2ZnSnSe4-CdS-ZnO solar cells with a total area efficiency of 9.7%. The absorber layer was fabricated by selenization of sputtered Cu10Sn90, Zn, and Cu multilayers. A large ideality factor of the order of 3 is observed in both illuminated and dark IV-curves, which seems to point in the direction of complex recombination mechanisms such as recombination through fluctuating potentials in the conduction and valence bands of the solar cell structure. A potential barrier of about 135 meV in the device seems to be responsible for an exponential increase of the series resistance at low temperatures, but at room temperature, the effect of this barrier remains relatively small. The free carrier density in the absorber is of the order of 1015 cm−3 and does not vary much as the temperature is decreased.

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Cu2ZnSnSe4 (CZTSe) thin film solar cells are promising emergent photovoltaic technologies based on low‐bandgap absorber layer with high absorption coefficient. To reduce optical losses in such devices and thus improve their efficiency, numerical simulations of CZTSe solar cells optical characteristics can be performed based on individual optical properties of each layer present in the cell structure. In this contribution, we have first determined the optical coefficients of individual thin films (i.e., (n, k) of the absorber, buffer, and window layers) to build a realistic model simulating the optical behavior of the whole cell stack we propose. Optical characterization was performed using two approaches, one based on ellipsometry measurements for characterizing thin flat cadmium sulfide (CdS) and zinc oxide (ZnO) layers and the other relying on reflectance and transmission (R/T) analysis for the rough CZTSe absorber. Then, we performed numerical simulations using as input experimental optical parameters predicting optimal CZTSe cell structure minimizing optical losses. The impact of each layer's thickness on the cell's short‐circuit current has been studied. A set of optimal thicknesses of each of the active layers was proposed. Finally, the proposed optical optimization was experimented practically leading to CZTSe cells with 9.7% and 10.4% efficiencies.

The present contribution aims at determining the impact of modifying the properties of the absorber/buffer layer interface on the electrical performance of Cu2ZnSnSe4 (CZTSe) thin‐film solar cells, by using a Cd2+ partial electrolyte (Cd PE) treatment of the absorber before the buffer layer deposition. In this work, CZTSe/CdS solar cells with and without Cd PE treatment were compared with their respective Cu(In,Ga)Se2 (CIGSe)/CdS references. The Cd PE treatment was performed in a chemical bath for 7 min at 70 °C using a basic solution of cadmium acetate. X‐ray photoemission spectroscopy measurements have revealed the presence of Cd at the absorber surface after the treatment. The solar cells were characterized using current density–voltage (J–V), external quantum efficiency, and drive‐level capacitance profiling measurements. For the CZTSe‐based devices, the fill factor increased from 57.7% to 64.0% when using the Cd PE treatment, leading to the improvement of the efficiency (η) from 8.3% to 9.0% for the best solar cells. Similar observations were made on the CIGSe solar cell reference. This effect comes from a considerable reduction of the series resistance (RS) of the dark and light J–V, as determined using the one‐diode model. The crossover effect between dark and light J–V curves is also significantly reduced by Cd PE treatment. Copyright © 2015 John Wiley & Sons, Ltd.

We have investigated different nonidealities in Cu 2 ZnSnSe 4 -CdS-ZnO solar cells with 9.7% conversion efficiency, in order to determine what is limiting the efficiency of these devices. Several nonidealities could be observed. A barrier of about 300 meV is present for electron flow at the absorber-buffer heterojunction leading to a strong crossover behavior between dark and illuminated current-voltage curves. In addition, a barrier of about 130 meV is present at the Mo-absorber contact, which could be reduced to 15 meV by inclusion of a TiN interlayer. Admittance spectroscopy results on the devices with the TiN backside contact show a defect level with an activation energy of 170 meV. Using all parameters extracted by the different characterization methods for simulations of the two-diode model including injection and recombination currents, we come to the conclusion that our devices are limited by the large recombination current in the depletion region. Potential fluctuations are present in the devices as well, but they do not seem to have a special degrading effect on the devices, besides a probable reduction in minority carrier lifetime through enhanced recombination through the band tail defects.

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This study concerns structural and optothermal properties of iron ditelluride layered structures which were fabricated via a low-cost protocol. The main precursors were FeCl3· 6H2O and Fe2O3. After a heat treatment within a tellurium-rich medium at various temperatures (470°C, 500°C, and 530°C) during 24 h, classical analyses have been applied to the iron ditelluride layered structures. A good crystalline state with a preferential orientation of the crystallites along (111) direction has been recorded. Moreover, additional opto-thermal investigation and analyses within the framework of the Lattice Compatibility Theory gave plausible explanation for prompt temperature-dependent incorporation of tellurium element inside hematite elaborated matrices.