Topographic x-ray diffraction images of ultrasonic waves in a thick silicon crystal are presented. The stationary nodal pattern of an acoustic field in the crystal is displayed, including that due to a set of plane standing waves. The images were achieved by making use of the anomalous transmission of x rays, and are of preliminary nature.
The effect of an ultrasonic wave on the integrated intensity in the Borrmann effect has been used to calculate the ultrasonic wave amplitude in a silicon crystal.
Subject Classifications: 85.22; 35.65, 35.68.
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