1975
DOI: 10.1121/1.380692
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X-ray measurement of an ultrasonic wave amplitude in a crystal

Abstract: The effect of an ultrasonic wave on the integrated intensity in the Borrmann effect has been used to calculate the ultrasonic wave amplitude in a silicon crystal. Subject Classifications: 85.22; 35.65, 35.68.

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Cited by 4 publications
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“…The major limitation of the microscope observation method is that the machining marks, indicating diamond grains trajectories, can only be observed on the RUM-machined surface of ductile materials (The details of the microscope observation method will be reviewed in Section 2 of this paper.). In addition, some methods have been reported for measuring ultrasonic vibration amplitude in other applications [25][26][27][28][29][30][31][32][33][34], which can be potentially utilized in RUM without machining of materials. The investigations on all of these reported methods indicate that there is a lack of methods to measure ultrasonic vibration amplitude in RUM machining of brittle materials.…”
Section: Introductionmentioning
confidence: 99%
“…The major limitation of the microscope observation method is that the machining marks, indicating diamond grains trajectories, can only be observed on the RUM-machined surface of ductile materials (The details of the microscope observation method will be reviewed in Section 2 of this paper.). In addition, some methods have been reported for measuring ultrasonic vibration amplitude in other applications [25][26][27][28][29][30][31][32][33][34], which can be potentially utilized in RUM without machining of materials. The investigations on all of these reported methods indicate that there is a lack of methods to measure ultrasonic vibration amplitude in RUM machining of brittle materials.…”
Section: Introductionmentioning
confidence: 99%