This paper proposes a novel Depth From Defocus (DFD) technique based on the property that two images having different focus settings coincide if they are reblurred with the opposite focus setting, which is referred to as the "cross reblurring" property in this paper. Based on the property, the proposed technique estimates the block-wise depth profile for a target object by minimizing the mean squared error between the crossreblurred images. Unlike existing DFD techniques, the proposed technique is free of lens parameters and independent of point spread function models. A compensation technique for a possible pixel disalignment between images is also proposed to improve the depth estimation accuracy. The experimental results and comparisons with the other DFD techniques show the advantages of our technique.
The stable monomer dianion of the title compound was formed by the contact of its tetrahydrofuran-d8 or 1,2-dimethoxyethane-d10 solution with sodium metal at 5 °C and was characterized by means of its 1H and 13C NMR spectra.
The mechanism and effect of a new extrinsic gettering method utilizing excimer laser irradiation called excimer laser gettering (ELG) was examined by transmission electron microscopy (TEM) observation and measurements of the electric properties of metal‐oxide‐semiconductor (MOS) capacitors. By means of TEM, stacking fault tetrahedra and V‐shaped dislocations were found in the irradiated regions of Si wafers and these defects were proved to be thermally stable. Dielectric breakdown failure of SiO2 films and generation lifetime of minority carriers were improved remarkably by ELG. It was confirmed that the gettering effect of ELG has higher temperature persistence than sandblasting methods used heretofore.
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