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Optical high quality semi-organic piperazinium tetrachlorozincate monohydrate, [C4H12N2] ZnCl4. H2O (PTCZ) single crystals were grown by conventional solution method. The structure of grown crystal was confirmed by the single crystal X-ray diffraction (SXRD) analysis. The material phase purities and its various (hkl) planes have been confirmed by the powder X-ray diffraction (PXRD) analysis at room temperature. The different functional groups were confirmed by the Fourier-transform infrared (FTIR) spectroscopy. The optical quality of the PTCZ single crystal and band gap energy have been identified by the UV-Vis NIR spectral analysis and also calculated refractive index of the material. The thermal stability of the PTCZ single crystal was investigated by TG-DTA. The hardness related properties were analyzed by microhardness tester. The dielectric properties have been measured on the grown single crystal and the electronic polarizability value has been calculated with various theoretical approach. The etching process was carried out on the grown crystal to finding the dislocation density. The crystal atomic perfection has been investigated by the high resolution X-ray diffraction (HRXRD) or Rocking curve (RC) analysis. The Z-scan measurement has been carried out to finding third-order optical susceptibility (χ(3)) of the grown single crystal using solid state laser (640 nm).