The growth and structural properties of GaN/AlN core-shell nanowire heterostructures have been studied using a combination of resonant x-ray diffraction, Raman spectroscopy and high resolution transmission electron microscopy experiments. For a GaN core of 20 nm diameter on average surrounded by a homogeneous AlN shell, the built-in strain in GaN is found to agree with theoretical calculations performed using a valence force field model. It is then concluded that for an AlN thickness up to at least 12 nm both core and shell are in elastic equilibrium. However, in the case of an inhomogeneous growth of the AlN shell caused by the presence of steps on the sides of the GaN core, plastic relaxation is found to occur. Consistent with the presence of dislocations at the GaN/AlN interface, it is proposed that this plastic relaxation, especially efficient for AlN shell thickness above 3 nm, is promoted by the shear strain induced by the AlN inhomogeneity.
Generating entangled graph states of qubits requires high entanglement rates, with efficient detection of multiple indistinguishable photons from separate qubits. Integrating defect-based qubits into photonic devices results in an enhanced photon collection efficiency, however, typically at the cost of a reduced defect emission energy homogeneity. Here, we demonstrate that the reduction in defect homogeneity in an integrated device can be partially offset by electric field tuning. Using photonic device-coupled implanted nitrogen vacancy (NV) centers in a GaP-on-diamond platform, we demonstrate large field-dependent tuning ranges and partial stabilization of defect emission energies. These results address some of the challenges of chip-scale entanglement generation. 19 NV centers within ∼ 15 nm of the diamond surface, created via implantation and annealing, couple evanescently with the GaP layer. As a result of the static dipole moment of the defect's excited state, there is variation in emission energy both between different defects, due to variation in the local environment caused by implantation and processing damage, and in the emission energy of a single defect over time due to electric field fluctuations. However, this dipole moment also enables electric field control of the defect's emission energy. 6,15,20,21 We provide this control through the addition of Ti/Au electrodes to this GaP-on-diamond photonics platform.In the photonic devices used in these experiments,
22Measurements were performed between 12-14 K in a closed-cycle He cryostat. A 532 nm laser was used for optical excitation, focused onto the sample with a 0.7 NA microscope objective. Photoluminescence (PL) was collected from the grating coupler using the same objective, coupled into a grating spectrometer, and detected by a CCD camera (Figure 1(a)).The input and collection optical paths were separated by a 562 nm dichoric beamsplitter.Bias voltages were applied using a computer-controlled piezocontroller in the range of 0-100 V.We first demonstrate electric-field tuning of a waveguide-coupled NV center. Exciting We also electrically control the emission energy of a resonator-coupled NV center. We first tune the cavity mode of a waveguide-coupled disk resonator onto NV ZPL resonance via Xe gas deposition, while collecting the PL emission from the waveguide grating coupler.The Xe gas deposition results in a redshift of the resonator cavity mode. Figure 2 (b, left) shows the resulting Xe gas tuning curve for one disk resonator. Xe gas flow is halted from t ∼ 15 minutes to t ∼ 45 minutes to perform two voltage experiments and then resumed.NV centers that couple with the cavity mode are bright when in resonance with the cavity mode and not visible otherwise.19 There are several NV centers that couple to the cavity mode for this particular disk resonator. With the cavity mode tuned to resonance with two NV centers, we apply a square wave bias voltage (Figure 2(b)), and we see the two ZPL emission lines moving in response to the applied ...
International audienceNucleation of GaN nanowires grown by plasma-assisted molecular beam epitaxy is studied through a combination of two in situ tools: grazing incidence x-ray diffraction and reflection high energy electron diffraction. Growth on bare Si(111) and on AlN/Si(111) is compared. A significantly larger delay at nucleation is observed for nanowires grown on bare Si(111). The difference in the nucleation delay is correlated to a dissimilarity of chemical reactivity between Al and Ga with nitrided Si(111)
Second harmonic conversion from 1550 nm to 775 nm with an efficiency of 400% W −1 is demonstrated in a gallium phosphide (GaP) on oxide integrated photonic platform. The platform consists of doubly-resonant, phase-matched ring resonators with quality factors Q ∼ 10 4 , low mode volumes V ∼ 30(λ/n) 3 , and high nonlinear mode overlaps. Measurements and simulations indicate that conversion efficiencies can be increased by a factor of 20 by improving the waveguide-cavity coupling to achieve critical coupling in current devices.
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