Abstract. Strategic considerations and publications dealing with the future of industrial production are significantly influenced these days by the concept of “Industrie 4.0”. For this reason the field of measurement technology for industrial production must also tackle this concept when thinking about future trends and challenges in metrology. To this end, the Manufacturing Metrology Roadmap 2020 of the VDI/VDE Society for Measurement and Automatic Control (GMA) was published in 2011 (VDI/VDE-GMA, 2011; Imkamp et al., 2012). The content of this roadmap is reviewed and extended here, covering new developments in the field of the Industrie 4.0 concept and presented with expanded and updated content.
Achieving traceability is crucial for complex measurement techniques, especially for coordinate measuring machines (CMMs). For CMMs using tactile probes, traceability can for certain measurements be achieved using model-based uncertainty budgets. Up to now, uncertainty simula-tions could be used applicable only for tactile CMM measurements of regular geometries, but are available as an add-on for different CMMs. This procedure is accepted by guidelines and inter-national standards (VDI/VDE 2617-7, supplement 1 [1] to GUM). Furthermore, empirical ap-proaches to assess the measurement uncertainty by means of calibrated workpieces or prior know-ledge exist or are under development. These approaches can as a matter of principle also be used for CMMs featuring computed tomography (CT). In this paper, the empirical assessment of the mea-surement uncertainty of the upcoming measurement technology CT [2, 3] will be discussed uniting the present approaches and the current knowledge, with the focus being on the applicability of con-cepts for users in industry. For this purpose, the influences on dimensional CT measurements are analyzed and evaluated, taking the measurement data of a current industrial micro CT system as a basis.
The integration of silicon micro probing systems into conventional gear measuring instruments (GMIs) allows fully automated measurements of external involute micro spur gears of normal modules smaller than 1 mm. This system, based on a silicon microprobe, has been developed and manufactured at the Institute for Microtechnology of the Technische Universität Braunschweig. The microprobe consists of a silicon sensor element and a stylus which is oriented perpendicularly to the sensor. The sensor is fabricated by means of silicon bulk micromachining. Its small dimensions of 6.5 mm × 6.5 mm allow compact mounting in a cartridge to facilitate the integration into a GMI. In this way, tactile measurements of 3D microstructures can be realized. To enable three-dimensional measurements with marginal forces, four Wheatstone bridges are built with diffused piezoresistors on the membrane of the sensor. On the reverse of the membrane, the stylus is glued perpendicularly to the sensor on a boss to transmit the probing forces to the sensor element during measurements. Sphere diameters smaller than 300 µm and shaft lengths of 5 mm as well as measurement forces from 10 µN enable the measurements of 3D microstructures. Such micro probing systems can be integrated into universal coordinate measuring machines and also into GMIs to extend their field of application. Practical measurements were carried out at the Physikalisch-Technische Bundesanstalt by qualifying the microprobes on a calibrated reference sphere to determine their sensitivity and their physical dimensions in volume. Following that, profile and helix measurements were carried out on a gear measurement standard with a module of 1 mm. The comparison of the measurements shows good agreement between the measurement values and the calibrated values. This result is a promising basis for the realization of smaller probe diameters for the tactile measurement of micro gears with smaller modules.
Among profiles, helix and tooth thickness pitch is one of the most important parameters of an involute gear measurement evaluation. In principle, coordinate measuring machines (CMM) and CNC-controlled gear measuring machines as a variant of a CMM are suited for these kinds of gear measurements. Now the Japan National Institute of Advanced Industrial Science and Technology (NMIJ/AIST) and the German national metrology institute the Physikalisch-Technische Bundesanstalt (PTB) have each developed independently highly accurate pitch calibration methods applicable to CMM or gear measuring machines. Both calibration methods are based on the so-called closure technique which allows the separation of the systematic errors of the measurement device and the errors of the gear. For the verification of both calibration methods, NMIJ/AIST and PTB performed measurements on a specially designed pitch artifact. The comparison of the results shows that both methods can be used for highly accurate calibrations of pitch standards.
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