Narrow band noise (NBN) associated with the sliding motion of Charge density wave (CDW)
is not so easy to measure in a bulk K0.3MoO3, because of the quasi one-dimensional effect. Then, This
study proposes a new technique of thin-film CDW (2-D) and nano-scale CDW (1-D) fabrication on a
bulk sample to avoid the 3-D interaction, and to realize the 1-D features experimentally, by using
H-ion beam irradiation and electron beam lithography. Consequently, the different a t the 1-D sample
has been dramatically reduced in the relation within error 1.5%. Moreover, inclination of broad band
noise (BBN) which is another noise generated at the time of CDW conduction almost disappeared in
l-D sample.
ABSTRACT-A horizontal thin film head has been proposed to achieve a high density recording and to integrate the head elements.We have developed a new horizontal head which has a optimized core structure near the gap. Core structure was optimized by simulation using finite element method.From the calculated results, new horizontal heads were fabricated and 25 dB SNR at 40 kbpi was obtained with 5 Jl m track width heads.
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